Description
FEI Company Expida 1285 (DA300)Configuration
-NG SEM Electron Column -Sidewinder Column -300 mm Stage -ETD/TLD/CDEM Detector -Omniprobe -PT GIS -Cap Probe -300 MM loaderOEM Model Description
The FEI Expida 1285 offers the ultimate in defect characterization, failure analysis and TEM sample preparation on patterned and unpatterned wafers. With fast and accurate 3D defect characterization, you get increased control and improved yield. The Expida 1285 includes an integrated front-end module designed to simultaneously handle 200mm and 300mm wafers using load port modules in addition to all of the performance specification of the Expida 1255S.Documents
No documents
CATEGORY
Defect Inspection
Last Verified: 2 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
137369
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
EXPIDA 1285
CATEGORY
Defect Inspection
Last Verified: 2 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
137369
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
FEI Company Expida 1285 (DA300)Configuration
-NG SEM Electron Column -Sidewinder Column -300 mm Stage -ETD/TLD/CDEM Detector -Omniprobe -PT GIS -Cap Probe -300 MM loaderOEM Model Description
The FEI Expida 1285 offers the ultimate in defect characterization, failure analysis and TEM sample preparation on patterned and unpatterned wafers. With fast and accurate 3D defect characterization, you get increased control and improved yield. The Expida 1285 includes an integrated front-end module designed to simultaneously handle 200mm and 300mm wafers using load port modules in addition to all of the performance specification of the Expida 1255S.Documents
No documents