
Description
Critical dimension scanning electron microscope (CD-SEM)Configuration
No ConfigurationOEM Model Description
None ProvidedDocuments
No documents
KLA
8250XP
CATEGORY
CD-SEM
Last Verified: 8 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
156358
Wafer Sizes:
Unknown
Vintage:
2001
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Critical dimension scanning electron microscope (CD-SEM)Configuration
No ConfigurationOEM Model Description
None ProvidedDocuments
No documents