Description
CD SEMConfiguration
NT Platform System Computer Dell Precision Work Station (Dual Core Processor) Raid Array (2 drive) OS – Windows NT 4.0 Main System Application – 6.1.SR2+ 3 Cassette Stations – Wafer 4” 5” 6” 8” Capable PRI Robot (with Class 1 wafer scanner) and Prealigner Electron Column – E Column Electron Source – Refurbished Scintillator Detector – New Energy Filter – Refurbished Wein Filter Apertures (2 each) – New Quick Pump (Optional)OEM Model Description
The KLA-Tencor 8100XP CD SEM is a state-of-the-art scanning electron microscope used in semiconductor manufacturing. It enables precise and fast measurements of critical dimensions (CD) in small device geometries. The CD SEM has advanced capabilities for imaging and measuring high aspect ratio features, ensuring optimum device performance. It offers productivity-enhancing features such as high throughput, networking, offline recipe setup, and full system automation.Documents
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KLA
8100XP
Verified
CATEGORY
CD-SEM
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
49393
Wafer Sizes:
4"/100mm, 5"/125mm, 6"/150mm, 8"/200mm
Vintage:
1998
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Logistics Support
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Money Back Guarantee
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Transaction Insured by Moov
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Refurbishment Services
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KLA
8100XP
Verified
CATEGORY
CD-SEM
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
49393
Wafer Sizes:
4"/100mm, 5"/125mm, 6"/150mm, 8"/200mm
Vintage:
1998
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
CD SEMConfiguration
NT Platform System Computer Dell Precision Work Station (Dual Core Processor) Raid Array (2 drive) OS – Windows NT 4.0 Main System Application – 6.1.SR2+ 3 Cassette Stations – Wafer 4” 5” 6” 8” Capable PRI Robot (with Class 1 wafer scanner) and Prealigner Electron Column – E Column Electron Source – Refurbished Scintillator Detector – New Energy Filter – Refurbished Wein Filter Apertures (2 each) – New Quick Pump (Optional)OEM Model Description
The KLA-Tencor 8100XP CD SEM is a state-of-the-art scanning electron microscope used in semiconductor manufacturing. It enables precise and fast measurements of critical dimensions (CD) in small device geometries. The CD SEM has advanced capabilities for imaging and measuring high aspect ratio features, ensuring optimum device performance. It offers productivity-enhancing features such as high throughput, networking, offline recipe setup, and full system automation.Documents
No documents