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High-resolution critical-dimension measurement scanning electron microscopes (CD-SEMs)Documents
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HITACHI
S-8840
CATEGORY
CD-SEM
Last Verified: 23 days ago
Key Item Details
Condition:
Parts Tool
Operational Status:
Unknown
Product ID:
128711
Wafer Sizes:
Unknown
Vintage:
1997
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
High-resolution critical-dimension measurement scanning electron microscopes (CD-SEMs)Documents
No documents