Description
SMIF Reticle Size - 6' Wafer Of Type: Notch at 6 o'clock 3 LoadportConfiguration
Process- MetrologyOEM Model Description
VeraSEM™ is a metrology-SEM system that is the first of its kind in the industry. It extends the capabilities of a conventional CD-SEM system beyond just critical dimensional (CD) measurement, allowing for the monitoring of a variety of challenging process parameters. This means that VeraSEM™ provides a more comprehensive and versatile solution for process monitoring, making it a valuable tool for industries that require precise and accurate measurements.Documents
No documents
Verified
CATEGORY
CD-SEM
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
110826
Wafer Sizes:
12"/300mm
Vintage:
2002
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
APPLIED MATERIALS (AMAT)
VeraSEM
CATEGORY
CD-SEM
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
110826
Wafer Sizes:
12"/300mm
Vintage:
2002
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
SMIF Reticle Size - 6' Wafer Of Type: Notch at 6 o'clock 3 LoadportConfiguration
Process- MetrologyOEM Model Description
VeraSEM™ is a metrology-SEM system that is the first of its kind in the industry. It extends the capabilities of a conventional CD-SEM system beyond just critical dimensional (CD) measurement, allowing for the monitoring of a variety of challenging process parameters. This means that VeraSEM™ provides a more comprehensive and versatile solution for process monitoring, making it a valuable tool for industries that require precise and accurate measurements.Documents
No documents