Skip to main content
Moov logo

Moov Icon
KLA / ORBOTECH ULTRA DISCOVERY VM
    Description
    Ultra Discovery VM delivers simple, intelligent, and powerful AOI performance with 10 µm line/space inspection capabilities for FC-BGA, PBGA, CSP, and COF production. Delivering super clear images essential for capturing the finest defects, the system achieves outstanding AOI results with minimal effort or training, even on complicated panels. Most of the manufacturer’s valuable time on the system is spent inspecting panels. Logic false calls are virtually eliminated and overall false calls are minimized, saving precious verification time. Benefits High throughput and superior detection with a minimal number of false calls Especially designed for inspection of the finest lines down to 10 µm Quick setup even for the most complicated jobs for higher productivity Automation ready Very high uptime SIP Technology Push-to-Scan: A “no setup” process Top AOI results with minimal effort or training The easiest, user-friendly interface (GUI) Full “Step and Repeat” functions Visual Intelligence: Using SIP Technology, Ultra Discovery VM introduces Orbotech’s detection paradigm to the world of fine-line FC-BGA, PBGA/CSP, and COF production. With the Visual Intelligence Detection Engine, now dedicated for IC substrate applications, manufacturers no longer have to choose between detection and false calls or waste time on non-critical defects. For the first time in AOI, detect all you want, and only what you want. Ultra Discovery VM is equipped with a super-fast optical head, which together with its dedicated IC substrate panel understanding, delivers exceptionally high throughput, superior detection, and low false call rates. The optical head is specially designed for inspection of the finest lines down to 10 µm. The customized professional lens, featuring unique wide-angle illumination, delivers very clear images essential for capturing the finest defects. Visual Intelligence: Full panel understanding, context-based detection engine Equipped with ultra-fast sensors and powerful data processing for maximum inspection speed
    Configuration
    No Configuration
    OEM Model Description
    Ultra Discovery VM - For FC-CSP and FC-BGA designs down to 10µm. Orbotech’s Ultra Discovery VM AOI systems offer a new level of AOI performance. Discovery’s fieldproven SIP Technology has been designed to overcome the complex challenges of FC-BGAs and the most advanced PBGA/CSP and COFs.
    Documents

    No documents

    verified-listing-icon

    Verified

    CATEGORY
    AOI

    Last Verified: Over 30 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    137020


    Wafer Sizes:

    Unknown


    Vintage:

    2011


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    KLA / ORBOTECH ULTRA DISCOVERY VM

    KLA / ORBOTECH

    ULTRA DISCOVERY VM

    AOI
    Vintage: 2011Condition: Used
    Last VerifiedOver 30 days ago

    KLA / ORBOTECH

    ULTRA DISCOVERY VM

    verified-listing-icon
    Verified
    CATEGORY
    AOI
    Last Verified: Over 30 days ago
    listing-photo-bf200b870a1c42af88b3af2c141b24e1-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/90320/bf200b870a1c42af88b3af2c141b24e1/f102cdc76adf4eeeb27b24b3cf23e0ec_largeused2011orbotechultradiscoveryvm_mw.jpg
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    137020


    Wafer Sizes:

    Unknown


    Vintage:

    2011


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Ultra Discovery VM delivers simple, intelligent, and powerful AOI performance with 10 µm line/space inspection capabilities for FC-BGA, PBGA, CSP, and COF production. Delivering super clear images essential for capturing the finest defects, the system achieves outstanding AOI results with minimal effort or training, even on complicated panels. Most of the manufacturer’s valuable time on the system is spent inspecting panels. Logic false calls are virtually eliminated and overall false calls are minimized, saving precious verification time. Benefits High throughput and superior detection with a minimal number of false calls Especially designed for inspection of the finest lines down to 10 µm Quick setup even for the most complicated jobs for higher productivity Automation ready Very high uptime SIP Technology Push-to-Scan: A “no setup” process Top AOI results with minimal effort or training The easiest, user-friendly interface (GUI) Full “Step and Repeat” functions Visual Intelligence: Using SIP Technology, Ultra Discovery VM introduces Orbotech’s detection paradigm to the world of fine-line FC-BGA, PBGA/CSP, and COF production. With the Visual Intelligence Detection Engine, now dedicated for IC substrate applications, manufacturers no longer have to choose between detection and false calls or waste time on non-critical defects. For the first time in AOI, detect all you want, and only what you want. Ultra Discovery VM is equipped with a super-fast optical head, which together with its dedicated IC substrate panel understanding, delivers exceptionally high throughput, superior detection, and low false call rates. The optical head is specially designed for inspection of the finest lines down to 10 µm. The customized professional lens, featuring unique wide-angle illumination, delivers very clear images essential for capturing the finest defects. Visual Intelligence: Full panel understanding, context-based detection engine Equipped with ultra-fast sensors and powerful data processing for maximum inspection speed
    Configuration
    No Configuration
    OEM Model Description
    Ultra Discovery VM - For FC-CSP and FC-BGA designs down to 10µm. Orbotech’s Ultra Discovery VM AOI systems offer a new level of AOI performance. Discovery’s fieldproven SIP Technology has been designed to overcome the complex challenges of FC-BGAs and the most advanced PBGA/CSP and COFs.
    Documents

    No documents

    Similar Listings
    View All
    KLA / ORBOTECH ULTRA DISCOVERY VM

    KLA / ORBOTECH

    ULTRA DISCOVERY VM

    AOIVintage: 2011Condition: UsedLast Verified:Over 30 days ago
    KLA / ORBOTECH ULTRA DISCOVERY VM

    KLA / ORBOTECH

    ULTRA DISCOVERY VM

    AOIVintage: 2007Condition: UsedLast Verified:Over 60 days ago
    KLA / ORBOTECH ULTRA DISCOVERY VM

    KLA / ORBOTECH

    ULTRA DISCOVERY VM

    AOIVintage: 2007Condition: UsedLast Verified:Over 60 days ago