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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA 200 NANOLAB
    Description
    Dual Beam Ion SEM-FIB
    Configuration
    230V; 15 A 50/60Hz
    OEM Model Description
    The FEI Nova NanoLab 200 is a powerful tool for researchers and developers working with complex structures below 100 nanometers. It combines ultra-high resolution field emission scanning electron microscopy (SEM) and precise focused ion beam (FIB) etch and deposition to provide advanced capabilities and flexibility. This tool complements existing nanotechnology laboratory tools and extends the range of applications for nanoscale prototyping, machining, 2D and 3D-characterization, and analysis.
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    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA 200 NANOLAB

    verified-listing-icon

    Verified

    CATEGORY

    Microscope
    Last Verified: 17 days ago
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    82219

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

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    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA 200 NANOLAB
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPSNOVA 200 NANOLABMicroscope
    Vintage: 0Condition: Used
    Last Verified17 days ago

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA 200 NANOLAB

    verified-listing-icon

    Verified

    CATEGORY

    Microscope
    Last Verified: 17 days ago
    listing-photo-b28992bea294445c97077858f571516e-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2046/b28992bea294445c97077858f571516e/09c7a6f532f444b98f0be3898f8aa303_6057a6fd3efd4a5fa2c310d7c3c7ac8a1201a_mw.jpeg
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    listing-photo-b28992bea294445c97077858f571516e-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2046/b28992bea294445c97077858f571516e/0c6368007ad540b4ab0ae804be7c9261_a26743ead815400b83e3effb139b67891201a_mw.jpeg
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    listing-photo-b28992bea294445c97077858f571516e-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2046/b28992bea294445c97077858f571516e/a8e863bfb0dd463d8810829b6d269146_bd6d014a5b7c4eabaa2ab6a35295338b1201a_mw.jpeg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    82219

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Dual Beam Ion SEM-FIB
    Configuration
    230V; 15 A 50/60Hz
    OEM Model Description
    The FEI Nova NanoLab 200 is a powerful tool for researchers and developers working with complex structures below 100 nanometers. It combines ultra-high resolution field emission scanning electron microscopy (SEM) and precise focused ion beam (FIB) etch and deposition to provide advanced capabilities and flexibility. This tool complements existing nanotechnology laboratory tools and extends the range of applications for nanoscale prototyping, machining, 2D and 3D-characterization, and analysis.
    Documents

    No documents

    Similar Listings
    View All
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA 200 NANOLAB
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
    NOVA 200 NANOLAB
    MicroscopeVintage: 0Condition: UsedLast Verified: 17 days ago