TESCAN	

FERA3 XMH

MIRA II XMU-X6

The TESCAN S8000 is a Scanning Electron Microscope (SEM) that comes to satisfy the most demanding needs for image quality and sample microanalysis that routinely arise in different fields of research and technology. 

S8000

 XEIA 3 

A scanning electron microscope high vacuum model that is suitable for a wide range of applications where
large / extra-large conductive samples are investigated.

LYRA3 XMH

TESCAN VEGA’s 4th generation Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ software.

VEGA

Vega 3 LMH/XMH/GMH large/ extra large/ giant chamber models operate at high vacuum for the investigation of conductive samples with extraordinary imaging quality.

TESCAN

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FERA3 XMH

MIRA II XMU-X6

S8000

XEIA 3

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