SONIX

HS-1000

HS-3000

ECHO VS

QUANTUM 350

Vision CSAM

SONIX UHR-2000	

FUSION

ECHO-LS

AutoWafer is an ultrasonic wafer scanner for nondestructive testing (NDT) of wafers in development and production environments, providing high-resolution identification of bond defects in wafer applications such as MEMS, CMOS, memory, TSV and LED. Robotic cassette handling and sorting of approved and failed wafers helps speed production, while our advanced transducers and auto-analysis tools make it quick and easy to identify even the smallest, most subtle defects.

-The ideal automatic ultrasonic testing system for detecting wafer-to-wafer bonding defects
-A fully automated, production-ready wafer scanner for MEMS, CMOS, BSI sensors, memory, TSV, LED and other applications employing wafers 200mm and smaller
-Provides wafer map with die-level pass/fail indicators (optional)
-Provides analysis (optional)
-200mm SECS/GEM
-TSV entrenched metrology

AutoWafer

UHR-2001

SONIX

Overview

Active Listings

Total Products

Services

Top Products

HS-1000

HS-3000

ECHO VS

QUANTUM 350

List it with Moov and find the perfect buyer in no time at all.

All Products

See All Listings