Description
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Hitachi S-4700-II is a Cold Field Emission Gun Scanning Electron Microscope (CFE-SEM), it combines the versatility of PC control with a novel electron optical column to give an exceptional performance on large and small specimens. The S-4700-II also offers excellent low kV performance with a guaranteed resolution of 2.1 nm at 1 kV at a working distance of 1.5mm. Available image mode includes a secondary electron image. There are two secondary electron detectors; one above the objective lens, the other below. The Oxford EDS system is included. This S-4700 II is fully refurbished and operational at our Tustin, CA facility.OEM Model Description
HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.Documents
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HITACHI
S-4700 II
Verified
CATEGORY
SEM
Key Item Details
Condition:
Refurbished
Operational Status:
Unknown
Product ID:
23124
Wafer Sizes:
Unknown
Vintage:
Unknown
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Refurbishment Services
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HITACHI
S-4700 II
Verified
CATEGORY
SEM
Last Verified: Over 60 days ago
Key Item Details
Condition:
Refurbished
Operational Status:
Unknown
Product ID:
23124
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
Hitachi S-4700-II is a Cold Field Emission Gun Scanning Electron Microscope (CFE-SEM), it combines the versatility of PC control with a novel electron optical column to give an exceptional performance on large and small specimens. The S-4700-II also offers excellent low kV performance with a guaranteed resolution of 2.1 nm at 1 kV at a working distance of 1.5mm. Available image mode includes a secondary electron image. There are two secondary electron detectors; one above the objective lens, the other below. The Oxford EDS system is included. This S-4700 II is fully refurbished and operational at our Tustin, CA facility.OEM Model Description
HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.Documents
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