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6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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FISCHERSCOPE XDVM-T7.1-W
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The FISCHERSCOPE® X-RAY XDV®-μ instruments are Fischer's high-end X-ray fluorescence series. They offer precise coating thickness measurement and material analysis on tiny structures. Equipped with powerful silicon drift detectors and polycapillary optics, they ensure quick and repeatable measurements with high radiation intensity. These instruments find applications in the electronics and semiconductor industry for measuring small structures like bond surfaces, SMD components, and thin wires. The XDV®-μ instruments feature a long-distance capillary for precise measurements on assembled PCBs and connectors. With a spacious measuring chamber, advanced polycapillary optics, and fast DPP+ digital pulse processor, they deliver accurate and efficient results.
    Documents

    No documents

    FISCHERSCOPE

    XDVM-T7.1-W

    verified-listing-icon

    Verified

    CATEGORY
    X-Ray / XRD / XRF

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    84342


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    FISCHERSCOPE XDVM-T7.1-W

    FISCHERSCOPE

    XDVM-T7.1-W

    X-Ray / XRD / XRF
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    FISCHERSCOPE

    XDVM-T7.1-W

    verified-listing-icon
    Verified
    CATEGORY
    X-Ray / XRD / XRF
    Last Verified: Over 60 days ago
    listing-photo-7d6b7d80c35f400aa5f88e29f24b0f0f-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    84342


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The FISCHERSCOPE® X-RAY XDV®-μ instruments are Fischer's high-end X-ray fluorescence series. They offer precise coating thickness measurement and material analysis on tiny structures. Equipped with powerful silicon drift detectors and polycapillary optics, they ensure quick and repeatable measurements with high radiation intensity. These instruments find applications in the electronics and semiconductor industry for measuring small structures like bond surfaces, SMD components, and thin wires. The XDV®-μ instruments feature a long-distance capillary for precise measurements on assembled PCBs and connectors. With a spacious measuring chamber, advanced polycapillary optics, and fast DPP+ digital pulse processor, they deliver accurate and efficient results.
    Documents

    No documents

    Similar Listings
    View All
    FISCHERSCOPE XDVM-T7.1-W

    FISCHERSCOPE

    XDVM-T7.1-W

    X-Ray / XRD / XRFVintage: 0Condition: UsedLast Verified:Over 60 days ago