SiPHER
Category
Wet Processing / Wafer CleaningOverview
The SiPHER is a fully automated photoluminescence metrology system for the detection and mapping of 300mm substrate defects and metallic contamination. SiPHER detects and quantifies near surface and bulk metallic contamination in both bulk silicon and silicon epitaxial layers.
Active Listings
4
Services
Inspection, Insurance, Appraisal, Logistics
Top Listings
ONTO / NANOMETRICS / ACCENT / BIO-RAD
SiPHER
Wet Processing / Wafer CleaningVintage: 2000Condition: UsedLast VerifiedOver 60 days agoONTO / NANOMETRICS / ACCENT / BIO-RAD
SiPHER
Wet Processing / Wafer CleaningVintage: Condition: UsedLast Verified29 days agoONTO / NANOMETRICS / ACCENT / BIO-RAD
SiPHER
Wet Processing / Wafer CleaningVintage: 12Condition: UsedLast VerifiedOver 30 days agoONTO / NANOMETRICS / ACCENT / BIO-RAD
SiPHER
Wet Processing / Wafer CleaningVintage: 2002Condition: UsedLast VerifiedOver 60 days ago
