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Marketplace > Thin Film / Film Thickness > KLA > UV-1250SE
KLA

UV-1250SE

Category
Thin Film / Film Thickness
Overview

The Prometrix UV-1250SE Thin Film Measurement System is a tool that can measure film thickness, refractive index, extinction coefficient, and goodness-of-fit of single or multi-layer thin film stacks. It combines spectroscopic ellipsometry and broadband UV spectrophotometry for non-destructive optical characterization. This results in greater productivity and tighter process control.

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