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6" Fab For Sale from Moov - Click Here to Learn More
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ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 3000
    Description
    Film Thickness Measurement System
    Configuration
    No Configuration
    OEM Model Description
    The NanoSpec 3000 film thickness measurement system is a state of the art, small spot spectroscopic reflectometer, built on a simple to use tabletop platform. A modern solid state linear diode array reflectometer is used to insure measurement speed and accuracy. The NanoSpec 3000 provides scanning from 480 to 800nm and can measure single-layer films such as oxide, nitride and photoresist, as well as multiple layer film stacks. Measurements can also be made on a \vide variety of other substrates including silicon, aluminum and gallium arsenide.
    Documents

    No documents

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 3000

    verified-listing-icon

    Verified

    CATEGORY
    Thin Film / Film Thickness

    Last Verified: 16 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    113765


    Wafer Sizes:

    6"/150mm


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 3000

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 3000

    Thin Film / Film Thickness
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 3000

    verified-listing-icon
    Verified
    CATEGORY
    Thin Film / Film Thickness
    Last Verified: 16 days ago
    listing-photo-bd57edac564449d79a9ee6e3ca2b1d25-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    113765


    Wafer Sizes:

    6"/150mm


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Film Thickness Measurement System
    Configuration
    No Configuration
    OEM Model Description
    The NanoSpec 3000 film thickness measurement system is a state of the art, small spot spectroscopic reflectometer, built on a simple to use tabletop platform. A modern solid state linear diode array reflectometer is used to insure measurement speed and accuracy. The NanoSpec 3000 provides scanning from 480 to 800nm and can measure single-layer films such as oxide, nitride and photoresist, as well as multiple layer film stacks. Measurements can also be made on a \vide variety of other substrates including silicon, aluminum and gallium arsenide.
    Documents

    No documents

    Similar Listings
    View All
    ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 3000

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 3000

    Thin Film / Film ThicknessVintage: 0Condition: UsedLast Verified:Over 60 days ago
    ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 3000

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 3000

    Thin Film / Film ThicknessVintage: 0Condition: UsedLast Verified:16 days ago
    ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 3000

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 3000

    Thin Film / Film ThicknessVintage: 0Condition: UsedLast Verified:Over 60 days ago