CategorySpectrometer / Ellipsomity
Wafer size 100mm ~ 300mm High-speed mode achieves a high throughput of 160 WPH, optimal for multipoint measurement of communications devices and other products. The VM-3500 can be optionally equipped with a trench measurement mechanism, enabling it to measure both film thickness and trench depth.
Inspection, Insurance, Appraisal, Logistics
- No products found