Marketplace > SEM / TEM / FIB > OLYMPUS > LEXT OLS4100
CategorySEM / TEM / FIB
The LEXT OLS4100 3D measuring laser microscope uses laser scanning to perform non-contact 3D measurement of complex surface features on electronic devices and other samples. As with current Olympus models, the LEXT OLS4100 guarantees both repeatability*1 and accuracy*2, while also being capable of high-resolution observation and highly accurate measurement over a wider area. It also features easier operation, including a function for acquiring 3D images automatically with a single click, and an image acquisition speed that is approximately twice as fast as the existing Olympus models.
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