MeRiT LE
Category
Reticle / Mask InspectionOverview
EUV repair results by ZEISS MeRiT LE High-end repair on a EUV photomask performed with a MeRiT® LE. Shown tiny extrusion repair reflects future technology nodes of 5nm node and beyond. Repair has been verified by using AIMS® EUV measurements.
Active Listings
0
Services
Inspection, Insurance, Appraisal, Logistics
Top Listings
- No products found