Description
No missing parts System was shutdown according to normal procedure Stage air bearing was damaged before shutting downConfiguration
LDS3300M Macro-Module 30um Head - sensitivity for surface defects down to 10um 100% Wafer Surface Inspection 200mm+300mm - Bare & Pattern Wafers Throughput 200mm - 140 WPH 300mm - 130 WPHOEM Model Description
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KLA / VISTEC / LEICA
LDS 3300M
Verified
CATEGORY
Reticle / Mask Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
23604
Wafer Sizes:
8"/200mm, 12"/300mm
Vintage:
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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KLA / VISTEC / LEICA
LDS 3300M
CATEGORY
Reticle / Mask Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
23604
Wafer Sizes:
8"/200mm, 12"/300mm
Vintage:
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No missing parts System was shutdown according to normal procedure Stage air bearing was damaged before shutting downConfiguration
LDS3300M Macro-Module 30um Head - sensitivity for surface defects down to 10um 100% Wafer Surface Inspection 200mm+300mm - Bare & Pattern Wafers Throughput 200mm - 140 WPH 300mm - 130 WPHOEM Model Description
None ProvidedDocuments
No documents