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KLA P-10
    Description
    Surface Profiler Max Wafer:200mm Calibrated to P-10 Specifications - Manual wafer load profilometer - Computer controlled - Measures roughness, waviness, step height, and other surface characteristics - Measures micro-roughness with up to 0.5Å (0.002 min.) resolution over short distances as well as waviness over a full, 60-mm scan.i thin - Built-in PC computing power - Operating System: Windows 3.1 - Windows base software control and data analysis - Brand new stylus - Brand new LCD monitor - Lab Table for KLA P10 Profiler - Operations Manual - Refurbished to Meet Original KLA-Tencor P-10 Specifications
    Configuration
    No Configuration
    OEM Model Description
    Tencor P-10 is an equipment used for research and development engineering that analyzes various substrates, including glass, ceramics, wafers, disks, and precision-machined surfaces. With an optional MicroHead II low-force measurement head, it can accurately measure soft surfaces like indium, gold, and photoresist.
    Documents

    No documents

    KLA

    P-10

    verified-listing-icon

    Verified

    CATEGORY

    Profiler
    Last Verified: Over 60 days ago
    Key Item Details

    Condition:

    Refurbished


    Operational Status:

    Unknown


    Product ID:

    64809


    Wafer Sizes:

    8"/200mm


    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
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    Refurbishment Services
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    verified-listing-icon

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    Key Item Details

    Condition:

    Refurbished


    Operational Status:

    Unknown


    Product ID:

    64809


    Wafer Sizes:

    8"/200mm


    Vintage:

    Unknown


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Surface Profiler Max Wafer:200mm Calibrated to P-10 Specifications - Manual wafer load profilometer - Computer controlled - Measures roughness, waviness, step height, and other surface characteristics - Measures micro-roughness with up to 0.5Å (0.002 min.) resolution over short distances as well as waviness over a full, 60-mm scan.i thin - Built-in PC computing power - Operating System: Windows 3.1 - Windows base software control and data analysis - Brand new stylus - Brand new LCD monitor - Lab Table for KLA P10 Profiler - Operations Manual - Refurbished to Meet Original KLA-Tencor P-10 Specifications
    Configuration
    No Configuration
    OEM Model Description
    Tencor P-10 is an equipment used for research and development engineering that analyzes various substrates, including glass, ceramics, wafers, disks, and precision-machined surfaces. With an optional MicroHead II low-force measurement head, it can accurately measure soft surfaces like indium, gold, and photoresist.
    Documents

    No documents

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