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Description
Surface Profiler Max Wafer:200mm Calibrated to P-10 Specifications - Manual wafer load profilometer - Computer controlled - Measures roughness, waviness, step height, and other surface characteristics - Measures micro-roughness with up to 0.5Å (0.002 min.) resolution over short distances as well as waviness over a full, 60-mm scan.i thin - Built-in PC computing power - Operating System: Windows 3.1 - Windows base software control and data analysis - Brand new stylus - Brand new LCD monitor - Lab Table for KLA P10 Profiler - Operations Manual - Refurbished to Meet Original KLA-Tencor P-10 SpecificationsConfiguration
No ConfigurationOEM Model Description
Tencor P-10 is an equipment used for research and development engineering that analyzes various substrates, including glass, ceramics, wafers, disks, and precision-machined surfaces. With an optional MicroHead II low-force measurement head, it can accurately measure soft surfaces like indium, gold, and photoresist.Documents
No documents
PREFERRED
SELLER
CATEGORY
Profiler
Last Verified: Over 60 days ago
Buyer pays 12% premium of final sale price
Key Item Details
Condition:
Refurbished
Operational Status:
Unknown
Product ID:
64809
Wafer Sizes:
8"/200mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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PREFERRED
SELLER
KLA
P-10
CATEGORY
Profiler
Last Verified: Over 60 days ago
Buyer pays 12% premium of final sale price
Key Item Details
Condition:
Refurbished
Operational Status:
Unknown
Product ID:
64809
Wafer Sizes:
8"/200mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Surface Profiler Max Wafer:200mm Calibrated to P-10 Specifications - Manual wafer load profilometer - Computer controlled - Measures roughness, waviness, step height, and other surface characteristics - Measures micro-roughness with up to 0.5Å (0.002 min.) resolution over short distances as well as waviness over a full, 60-mm scan.i thin - Built-in PC computing power - Operating System: Windows 3.1 - Windows base software control and data analysis - Brand new stylus - Brand new LCD monitor - Lab Table for KLA P10 Profiler - Operations Manual - Refurbished to Meet Original KLA-Tencor P-10 SpecificationsConfiguration
No ConfigurationOEM Model Description
Tencor P-10 is an equipment used for research and development engineering that analyzes various substrates, including glass, ceramics, wafers, disks, and precision-machined surfaces. With an optional MicroHead II low-force measurement head, it can accurately measure soft surfaces like indium, gold, and photoresist.Documents
No documents