Description
The Ambios Technology, Inc. XP Stylus Profiler is a computerized, high-sensitivity surface profiler that measures roughness, waviness, and step height in a variety of applications. It features the ability to measure precision step heights from under 10 angstroms to as large as 100 microns (400μm with the extended sensor option), the XP profiler provides more than five orders of magnitude of precision Z height measurement. The XP profiler provides an affordable, high-resolution surface measurement capability that nicely complements other analytical instruments.Configuration
Ambios XP2 is a standard stylus profilometer for measuring step heights in the tens of nm up to 400 um. Step heights from 50A to 400um can be made using a computer controlled stylus profilometer. The stylus force can be adjusted so polymers samples such as photoresist can be measured. List of the current issues: -The stage squeaks badly -The USB communication fails periodically requiring software and/or hardware restart -Sometimes the stage won’t move during a scan for half the scan, then it will kick onOEM Model Description
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AMBIOS TECHNOLOGY, INC
XP-2
Verified
CATEGORY
Profiler
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
53545
Wafer Sizes:
Unknown
Vintage:
2006
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Logistics Support
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Money Back Guarantee
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Transaction Insured by Moov
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Refurbishment Services
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AMBIOS TECHNOLOGY, INC
XP-2
Verified
CATEGORY
Profiler
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
53545
Wafer Sizes:
Unknown
Vintage:
2006
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
The Ambios Technology, Inc. XP Stylus Profiler is a computerized, high-sensitivity surface profiler that measures roughness, waviness, and step height in a variety of applications. It features the ability to measure precision step heights from under 10 angstroms to as large as 100 microns (400μm with the extended sensor option), the XP profiler provides more than five orders of magnitude of precision Z height measurement. The XP profiler provides an affordable, high-resolution surface measurement capability that nicely complements other analytical instruments.Configuration
Ambios XP2 is a standard stylus profilometer for measuring step heights in the tens of nm up to 400 um. Step heights from 50A to 400um can be made using a computer controlled stylus profilometer. The stylus force can be adjusted so polymers samples such as photoresist can be measured. List of the current issues: -The stage squeaks badly -The USB communication fails periodically requiring software and/or hardware restart -Sometimes the stage won’t move during a scan for half the scan, then it will kick onOEM Model Description
None ProvidedDocuments
No documents
Similar Listings
View AllNo Similar Listings