Teradyne’s semiconductor test portfolio is transforming the way you test chipsets for automotive, industrial, communications, consumer, smartphones, and computer and electronic game applications. Semiconductor devices span a broad range of functionality, from very simple low-cost devices such as appliance microcontrollers, operational amplifiers or voltage regulators to complex digital signal processors and microprocessors as well as memory devices.

TERADYNE

UltraPin is also known as UP. The UltraPin1600 is a high-density, high-speed digital instrument that can cover speeds of up to 2.2 Gbps and offers either 128 or 256 channels per instrument. It is equipped with multi-core, hardware-based advanced protocol-aware features, allowing for pin group-wise operation to be synchronized with the device data rate and timing. This eliminates the need for digital pattern programming for communication in standard databus protocols. The UltraPin1600 also has dedicated hardware for same-cycle source-synchronous and walking-strobe timing measurements, making it ideal for high-speed DDR and other critical applications. Additionally, the UltraPin1600 is compatible with test programs created with its legacy UltraPin800 and HSD1000 digital options. This makes it a versatile and powerful tool for a wide range of applications.

UltraPin1600

TSLX w/ 128L

MANIPULATOR

HSD1000

806-118-01

PDU-807816

IA-OPT585WX

BBAC

High Density Converter Test Option (HDCTO) for testing embedded ADC/DAC converters.

HDCTO

Z1888-2

TSLH 124

HDVS

HEXVS

DCIO BOARD

TSLH 121

UltraPin is also known as UP

The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. The UltraPin1600 implements Teradyne’s ground-breaking multicore, hardware-based Protocol Aware capability that allows individual pin groups to be saved to device data rate and timing and eliminates the need for digital patterns for programming standard data busses.

UltraPin800

TSLH 128

HEXVS+

HD DPS24

TXP universal column manipulator provides the widest range of motion, smallest footprint and lightest floorloading of any manipulator in its weight class.

The High Speed Digital 800 instrument (HSD800) is an option for the J750Ex-HD that provides digital functionality and characterization test. This instrument is designed to test all the components inside of MCU’s. It is a powerful tool for ensuring the quality and performance of microcontroller units. 

HSD800

** PARTS **

GENARD 228X ICT

The DC30 is a voltage and current source that extends the DC voltage to 30V to meet high voltage testing requirements such as mobile power management devices. It has a precision differential voltmeter and time measurement capability, similar to the UltraVI80.

DC30

DC75

HSD200

HSD 100

39-026-31

J750 HDDPS 24CHANNEL-E

VHFAC (Very High Frequency AC) is a type of AC instrument used in microFLEX/FLEX test systems. It provides waveform source and capture capabilities with arbitrary waveform generators (AWG) and digitizers. This allows for the testing of high-performance devices such as SoC and SiP devices at low test costs, as it can meet various test requirements. VHFAC is an important tool for ensuring the performance and reliability of these devices.

6" Fab For Sale from Moov - Click Here to Learn More

6" Fab For Sale from Moov - Click Here to Learn More

6" Fab For Sale from Moov - Click Here to Learn More

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UltraPin1600

MTO

TSLX w/ 128L

MANIPULATOR

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