Verigy provides advanced semiconductor test systems and solutions used by leading companies worldwide in design validation, characterization, and high-volume manufacturing test. Verigy offers scalable platforms for a wide range of system-on-chip (SOC) test solutions, and memory test solutions for Flash, DRAM including high-speed memories, as well as multi-chip packages (MCP). Verigy also provides advanced analysis tools that accelerate design debug and yield ramp processes.

ADVANTEST / VERIGY

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The VERIGY PS400, known as Pin Scale 400, is a high-density, flexible digital Channel Card designed for the V93000 Platform. It caters to a wide range of general-purpose core digital testing needs while complementing Verigy's digital offering. This Pin Card efficiently addresses various application requirements, from structural testing with reduced pin count and DC IO to broadside access functional testing, all within a single instrument, thanks to its flexible license options. The Pin Scale 400 is designed for seamless integration with existing Pin Scale Digital cards, as well as with the complete range of DC, mixed signal, and RF options available for the V93000 platform. It offers functional compatibility with the P and Ce series of digital pin cards. Built upon the proven V93000 test processor per pin architecture, the PS400 features true per pin AC and DC resources, a sequencer per pin structure, APG per pin structure, fail capture per pin, integrated TIA per pin, and new high-speed backbone communication technology, enabling unprecedented data transfer between the test system and the host computer. 

PS400

The VERIGY PS800, also known as the Pin Scale 800, is a highly scalable test solution designed to meet a wide range of performance needs. Starting at 200 Mbps for cost-effective, low-performance requirements, it can scale up to 800 Mbps to cater to higher performance demands, all achieved with a single digital card. With the industry-first Verigy InstaPin performance library and per-pin licenses, the Pin Scale 800 digital card can be configured to match specific device requirements, pin-by-pin, resulting in the most cost-effective testing approach. As test needs evolve for new device classes or next-generation performance, the Pin Scale 800 can be easily reconfigured through software, ensuring maximum return on investment by extending the platform's lifetime. 

PS800

The VERIGY PS3600 is a channel board utilized in the Pin Scale 3600 test system. It is a component of the V93000 SoC Test System which is a scalable platform architecture that tests a wide range of devices from low cost IoT to high-end devices such as advanced automotive devices or highly integrated multicore processors. The Pin Scale 3600 test system offers greater functionality while maintaining low cost of testing.

PS3600

The VERIGY PS1600 is a Final Test system designed to perform comprehensive testing at high speeds and with increased memory and density. With 128 pins operating at 1.6G, it offers twice the speed, twice the memory, and twice the density compared to previous models. This advanced test system ensures efficient and accurate testing, making it a valuable tool for semiconductor manufacturers seeking high-performance and reliable testing solutions for their products.

PS1600

The VERIGY C400 is a cost-optimized test system specifically designed for testing consumer applications. It utilizes lower-grade test processors to achieve cost-effectiveness. The model number indicates the maximum data rate in Gbit/s. As part of the Agilent 93000 SOC Series, the C400 shares the same test processor technology and mechanical design, ensuring compatibility and enabling test programs that cover a wide range of applications.

C400

The VERIGY C400E is a Final test system designed for semiconductor testing applications. It features an LTH (Big) test head, DUT Scale, and 56M scan memory, ensuring comprehensive testing capabilities. The system is equipped with seven GPDPS Power supplies, enabling efficient and accurate power delivery. Additionally, the C400E is equipped with High Speed Cards to cater to high-speed testing requirements, making it a powerful and versatile solution for final testing of semiconductor devices.

C400E

The Verigy V93000 Multi-Site Device Power Supply (Multi-Site DPS) is a low cost-of-test DPS solution that provides 8 channels per module for mixed signal applications.

MSDPS

Product Specifications
-Modular: 128 or 64 Channels
-1A/ch at 4.5V , 64A/card

DPS64

MCB BOARD 8M

DPS32

DM800

MCE 8M BOARD

UHC4

HSM3G

HSM3600

Locally intelligent 32 channel VI for ≤40V or 200mA DC, analog, & power management

PMU32

The DPS128’s per-pin time measurement unit (TMU) enables efficient measurement of high switching frequencies, duty cycles and fast rise/fall times found in today’s advanced power-management devices. With its sophisticated ganging options, this family of instruments can address a broad application space, and also supersedes legacy power instruments within the V93000 portfolio.

DPS128

UHC4T

DPS500mA

MBAV8

PS1600B

V93K METER

HSM4000

With the new AVI64 universal analog pin module, Advantest’s V93000 tester has all of the functionality needed to test advanced SoC devices.

AVI64

E7002-69520

E7002-66630

Pin Scale 9G (64 pins at >8G) >2x Speed, 2x Density 2x Memory

PS9G

The VERIGY 93000 CTH (Channel Testhead) is a crucial component of the ADVANTEST 93000 series of semiconductor test systems, extensively utilized in the semiconductor industry for testing and characterizing integrated circuits (ICs) during production. As an essential part of the overall test system, the CTH is responsible for providing specific functions required for accurate and efficient testing of IC devices.

93000 CTH

F80t

UHC4+

E8001-66412

(64 pins at 1.6G) 2x Speed 2x Memory + Memory Emulation

PS1600-ME

E8001-66495

SE-UDPS

E8012-66401

The cost-optimized models C400 and C200 use lower grade test processors for testing consumer applications. The model number indicates the maximum data rate in Gbit/s.

C200

Memory test card
The HSM6800, targeted for volume production test of ultra high-speed memories, offers native 6.8Gbps at-speed I/O and at-speed memory core access testing up to 64-sites GDDR5 in parallel as well as superior accuracy for best device quality and manufacturing yields.

HSM6800

I/O Channel Memory Depth (no mixed configurations possible): 8M

N2498B

V93K MSDPS CABLE 

E7002-66523

F120t

E8001-61670

E8010

E7124-04124

9490

E7996-66403

VI32

LTE Advanced, 802.11ac, WiMAX, Zero Overhead Upload

MBAV8+

The VERIGY C200E is a sophisticated semiconductor test system developed by Advantest Corporation. This advanced platform is specifically designed to conduct comprehensive testing and verification of integrated circuits (ICs) throughout the manufacturing process. It offers precise and reliable testing capabilities, making it an essential tool for semiconductor manufacturers seeking high-quality and efficient testing solutions for their IC devices.

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