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KLA ARCHER 200
  • KLA ARCHER 200
  • KLA ARCHER 200
  • KLA ARCHER 200
Description
No description
Configuration
No Configuration
OEM Model Description
The Archer 200 is an optical overlay control system designed to meet the performance and cost-of-ownership requirements for advanced design rules, including 32nm and double-patterning lithography. It features major improvements to its core optical design and an optional scatterometry measurement technology. This system offers tighter total measurement uncertainty, increased flexibility, higher productivity, and faster measurement. It uses industry-standard AIM or smaller µAIM targets.
Documents

No documents

CATEGORY
Overlay

Last Verified: Over 60 days ago

Key Item Details

Condition:

Refurbished


Operational Status:

Unknown


Product ID:

87792


Wafer Sizes:

12"/300mm


Vintage:

Unknown


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

KLA

ARCHER 200

verified-listing-icon
Verified
CATEGORY
Overlay
Last Verified: Over 60 days ago
listing-photo-e433b8b6b23e43bb85f538517eba3b98-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
Key Item Details

Condition:

Refurbished


Operational Status:

Unknown


Product ID:

87792


Wafer Sizes:

12"/300mm


Vintage:

Unknown


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No description
Configuration
No Configuration
OEM Model Description
The Archer 200 is an optical overlay control system designed to meet the performance and cost-of-ownership requirements for advanced design rules, including 32nm and double-patterning lithography. It features major improvements to its core optical design and an optional scatterometry measurement technology. This system offers tighter total measurement uncertainty, increased flexibility, higher productivity, and faster measurement. It uses industry-standard AIM or smaller µAIM targets.
Documents

No documents