LEICA MICROSYSTEMS

INM 20	

Fully automated inspection and measurement microscope.

INM 300

ERGOPLAN

DM6000M

INM 100

Motorized 6.3x-32x Zoom Forensic Comparison Macroscope Microscope

Motorized Focusing and Stage Forensic Bullet Comparison Macroscope Microscope

FS C

INM 200

DM R

High Power Forensic Comparison Microscope

CMF 2

S6D	

The Leica FTM200 is able to handle objects up to size of 200 mm.

FTM 200

The microscope system for the highest demands in the semiconductor industry.

INM 200 UV

DM4000M

TCS SP8 X

The Leica S4 E with Greenough optical system and 4.8:1 zoom provides large field of view up to 36.5mm, which is ideal for inspection, assembly and repair (i.e. PCB board).

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INM 20

INM 300

ERGOPLAN

DMC

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