8250-R
Category
CD-SEMOverview
The 8250-R reticle CD control system, which is based on the 8200/8400 CD SEM platform. The 8250-R provides extremely precise and high-throughput measurements on advanced reticles used in the production of sub-0.13-micron devices.
Active Listings
0
Services
Inspection, Insurance, Appraisal, Logistics
Top Listings
- No products found