NANOSEM 3D
Category
CD-SEMOverview
Introduced in fiscal 2002, the NanoSEM 3D system extends CD-SEM technology beyond the measurement of critical dimensions to enable the three-dimensional imaging of chip features to more precisely control their lithography and etch processes.
Active Listings
6
Services
Inspection, Insurance, Appraisal, Logistics
Top Listings
APPLIED MATERIALS (AMAT)
NANOSEM 3D
CD-SEMVintage: 2004Condition: UsedLast VerifiedOver 60 days agoAPPLIED MATERIALS (AMAT)
NANOSEM 3D
CD-SEMVintage: 2004Condition: UsedLast VerifiedOver 60 days agoAPPLIED MATERIALS (AMAT)
NANOSEM 3D
CD-SEMVintage: 2003Condition: UsedLast VerifiedOver 60 days agoAPPLIED MATERIALS (AMAT)
NANOSEM 3D
CD-SEMVintage: 2004Condition: UsedLast VerifiedOver 60 days ago