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KLA ARCHER AIM+
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The Archer AIM+ is an advanced optical overlay metrology tool that sets the standard for lithography process control through the > 45-nm node. It improves yield and cost of ownership with a 20% increase in throughput over previous-generation solutions. It features field-proven AIM grating-style technology, improved optics design, and high accuracy measurements. Its applications include overlay metrology, CMP, lithography, and wafer surface focus and analysis.
    Documents
    File icon

    KLA ARCHER AIM+.pdf

    KLA

    ARCHER AIM+

    verified-listing-icon

    Verified

    CATEGORY

    Metrology
    Last Verified: Over 60 days ago
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    58340

    Wafer Sizes:

    12"/300mm

    Vintage:

    2006

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    Transaction Insured by Moov
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    KLA

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    verified-listing-icon

    Verified

    CATEGORY

    Metrology
    Last Verified: Over 60 days ago
    listing-photo-c9a7ee41d2384173a1072f31c6cf684b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1458/c9a7ee41d2384173a1072f31c6cf684b/5b792dddb2854413938d1c39aacf2b4b_d94b1bd8a5ef4f8d82d52a082b6fe7eb1201a_mw.jpeg
    listing-photo-c9a7ee41d2384173a1072f31c6cf684b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1458/c9a7ee41d2384173a1072f31c6cf684b/7c12efc3f1ac4f34880e9181b44ce934_b80c21c9cfa64194a0d7e1285e27d1cd1201a_mw.jpeg
    listing-photo-c9a7ee41d2384173a1072f31c6cf684b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1458/c9a7ee41d2384173a1072f31c6cf684b/4f0bbd1b0d664e2983e2a0ccaad53355_a8cadfeb0c184de1ab35badfa58198e01201a_mw.jpeg
    listing-photo-c9a7ee41d2384173a1072f31c6cf684b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1458/c9a7ee41d2384173a1072f31c6cf684b/5fdf2e2d74c84ef98310395882061a31_b2ef839e4d094fe2a68c2f6c23ee94951201a_mw.jpeg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    58340

    Wafer Sizes:

    12"/300mm

    Vintage:

    2006

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The Archer AIM+ is an advanced optical overlay metrology tool that sets the standard for lithography process control through the > 45-nm node. It improves yield and cost of ownership with a 20% increase in throughput over previous-generation solutions. It features field-proven AIM grating-style technology, improved optics design, and high accuracy measurements. Its applications include overlay metrology, CMP, lithography, and wafer surface focus and analysis.
    Documents
    File icon

    KLA ARCHER AIM+.pdf

    Similar Listings
    View All
    KLA ARCHER AIM+
    KLA
    ARCHER AIM+
    MetrologyVintage: 0Condition: UsedLast Verified: Over 60 days ago
    KLA ARCHER AIM+
    KLA
    ARCHER AIM+
    MetrologyVintage: 0Condition: RefurbishedLast Verified: Over 60 days ago
    KLA ARCHER AIM+
    KLA
    ARCHER AIM+
    MetrologyVintage: 0Condition: RefurbishedLast Verified: Over 60 days ago