Description
ProfilometerConfiguration
Date of Mfg: 4/92 ±10 mm Scan Length 2 to 250 µm/sec Scan Speed 50/sec nominal Sampling Rate Vertical Resolution 1Å Resolution ±6.5 µm 25Å Resolution ±150µm 1.0-100 mg Stylus Programmable Force Range 0.1 mg Stylus Programmable Force Resolution 210 mm X, Y Maximum Travel 254 x 254 mm Maximum Sample SizeOEM Model Description
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KLA
ALPHA-STEP 300
Verified
CATEGORY
Profiler
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
57787
Wafer Sizes:
Unknown
Vintage:
Unknown
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Logistics Support
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Transaction Insured by Moov
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ALPHA-STEP 300
Verified
CATEGORY
Profiler
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
57787
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
ProfilometerConfiguration
Date of Mfg: 4/92 ±10 mm Scan Length 2 to 250 µm/sec Scan Speed 50/sec nominal Sampling Rate Vertical Resolution 1Å Resolution ±6.5 µm 25Å Resolution ±150µm 1.0-100 mg Stylus Programmable Force Range 0.1 mg Stylus Programmable Force Resolution 210 mm X, Y Maximum Travel 254 x 254 mm Maximum Sample SizeOEM Model Description
None ProvidedDocuments
No documents