Description
No descriptionConfiguration
• Elstar FEG Electron column, 350v–30kV • In-lens SE and BSE detector and STEM • Elstar Electron column is capable of sub-nanometer STEM images • Sidewinder Ion column: 30kV • Milling Power: 21nA beam current • CDEM with 5nm image resolution • Windows OS and FEI UI • Five-axis motorized compucentric stage with load lock • Specimen Coverage: 100mm diameter • Load Lock • Chamber scope for real time observation • Gas Injection System (GIS): Max 4 injectors 2 included, chemistry of choice • Vacuum System, oil free consisting IGP x 3, air cooled Turbo and dry PVPOEM Model Description
The Helios NanoLab 400 is a DualBeam system that integrates both ion and electron beams for Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) functionality in one machine. This allows users to switch between the two beams for quick and accurate navigation and milling. The convergence of the SEM and FIB at a short working distance enables precision “slice-and-view” cross-sectioning and analysis at high resolution. This system provides a powerful tool for sample preparation and analysis.Documents
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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
HELIOS NANOLAB 400
Verified
CATEGORY
Microscope
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
13114
Wafer Sizes:
Unknown
Vintage:
2015
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
HELIOS NANOLAB 400
Verified
CATEGORY
Microscope
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
13114
Wafer Sizes:
Unknown
Vintage:
2015
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
• Elstar FEG Electron column, 350v–30kV • In-lens SE and BSE detector and STEM • Elstar Electron column is capable of sub-nanometer STEM images • Sidewinder Ion column: 30kV • Milling Power: 21nA beam current • CDEM with 5nm image resolution • Windows OS and FEI UI • Five-axis motorized compucentric stage with load lock • Specimen Coverage: 100mm diameter • Load Lock • Chamber scope for real time observation • Gas Injection System (GIS): Max 4 injectors 2 included, chemistry of choice • Vacuum System, oil free consisting IGP x 3, air cooled Turbo and dry PVPOEM Model Description
The Helios NanoLab 400 is a DualBeam system that integrates both ion and electron beams for Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) functionality in one machine. This allows users to switch between the two beams for quick and accurate navigation and milling. The convergence of the SEM and FIB at a short working distance enables precision “slice-and-view” cross-sectioning and analysis at high resolution. This system provides a powerful tool for sample preparation and analysis.Documents
No documents