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PARTICLE MEASURING SYSTEMS (PMS) LASAIR 110
    Description
    No description
    Configuration
    Particle Measuring SAS 5800 Surface Analysis Particle Measuring System. Sizes and locates surface contamination and defects down to 0.10 micro-meters (PSL reference) in a fully automated 100mm - 200mm, cassette to cassette operation. The SAS 5800 includes teo polarized HE-NE Lasers which provide independent S and P polarization analysis. The contamination and defects are assigned as point, line and area defects. Accept/reject criteria is based on particle, scratch, area defect and STS (surface roughness). Sold As Is.
    OEM Model Description
    None Provided
    Documents

    No documents

    PARTICLE MEASURING SYSTEMS (PMS)

    LASAIR 110

    verified-listing-icon

    Verified

    CATEGORY

    Laser
    Last Verified: Over 60 days ago
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    14356

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

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    PARTICLE MEASURING SYSTEMS (PMS)LASAIR 110Laser
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    Last VerifiedOver 60 days ago

    PARTICLE MEASURING SYSTEMS (PMS)

    LASAIR 110

    verified-listing-icon

    Verified

    CATEGORY

    Laser
    Last Verified: Over 60 days ago
    listing-photo-acBR04jHDMpPNYKYfe_ARqgfqtNx-jFMOHenJM6fcXk-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/8GpEvJPy2xR_VLuMDsOOL12hQo47IOv-tZ0jmsJltK0/acBR04jHDMpPNYKYfe_ARqgfqtNx-jFMOHenJM6fcXk/WWyk1vDqwtoKoL1Yw4A2k9iS7ur24ccHPPRbg0KjACY_20190301_114504_f
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    14356

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    Particle Measuring SAS 5800 Surface Analysis Particle Measuring System. Sizes and locates surface contamination and defects down to 0.10 micro-meters (PSL reference) in a fully automated 100mm - 200mm, cassette to cassette operation. The SAS 5800 includes teo polarized HE-NE Lasers which provide independent S and P polarization analysis. The contamination and defects are assigned as point, line and area defects. Accept/reject criteria is based on particle, scratch, area defect and STS (surface roughness). Sold As Is.
    OEM Model Description
    None Provided
    Documents

    No documents

    Similar Listings
    View All
    PARTICLE MEASURING SYSTEMS (PMS) LASAIR 110
    PARTICLE MEASURING SYSTEMS (PMS)
    LASAIR 110
    LaserVintage: 2002Condition: UsedLast Verified: Over 60 days ago
    PARTICLE MEASURING SYSTEMS (PMS) LASAIR 110
    PARTICLE MEASURING SYSTEMS (PMS)
    LASAIR 110
    LaserVintage: 1998Condition: UsedLast Verified: Over 60 days ago