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OXFORD CMI 950
    Description
    No description
    Configuration
    standard configuration, see specification X-Ray fluorescence for analysis of materials (such as liquids and solid states) in order to obtain information about thickness, concentrataion, etc.Measurement system for layer thickness analysis of metallic surfaces and evaluation of concentrations of solutions (Au, Ni, Sn, Cu, Ag).System is fully packed on pallette (241kg, 1mx0,9mx1,5m)
    OEM Model Description
    None Provided
    Documents

    No documents

    OXFORD

    CMI 950

    verified-listing-icon

    Verified

    CATEGORY

    Analytical
    Last Verified: Over 60 days ago
    Key Item Details
    Condition:

    Unknown

    Operational Status:

    Unknown

    Product ID:

    12965

    Wafer Sizes:

    Unknown

    Vintage:

    2000

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    OXFORD

    CMI 950

    verified-listing-icon

    Verified

    CATEGORY

    Analytical
    Last Verified: Over 60 days ago
    listing-photo-4mLbx1odyJbTUO7t9FDLaK6rWJ3TMrtPLs57BZ5SbMI-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/kbP8CN_EubhSVbnpTQZJ6tPHQ93ku9XRczHz535d9K0/4mLbx1odyJbTUO7t9FDLaK6rWJ3TMrtPLs57BZ5SbMI/oAcyQZFwKcp21vB8sCegaIwUB24B5fRlrWOkNIbV37Y_20190315_085204_f
    listing-photo-4mLbx1odyJbTUO7t9FDLaK6rWJ3TMrtPLs57BZ5SbMI-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/kbP8CN_EubhSVbnpTQZJ6tPHQ93ku9XRczHz535d9K0/4mLbx1odyJbTUO7t9FDLaK6rWJ3TMrtPLs57BZ5SbMI/PolOTSipZ8_CZ4aBGwagrPg7ZAuoQ0-KTNsjg7k-9nU_20190315_085204_f
    Key Item Details
    Condition:

    Unknown

    Operational Status:

    Unknown

    Product ID:

    12965

    Wafer Sizes:

    Unknown

    Vintage:

    2000

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    standard configuration, see specification X-Ray fluorescence for analysis of materials (such as liquids and solid states) in order to obtain information about thickness, concentrataion, etc.Measurement system for layer thickness analysis of metallic surfaces and evaluation of concentrations of solutions (Au, Ni, Sn, Cu, Ag).System is fully packed on pallette (241kg, 1mx0,9mx1,5m)
    OEM Model Description
    None Provided
    Documents

    No documents

    Similar Listings
    View All

    No Similar Listings