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KLA P-16+
    Description
    No description
    Configuration
    Condition : Fully operational, Tested Specification : 100% OEM specs Configuration : XP Computer , Software 7.45, XT head (long range), up to 200 mm Includes Step height for calibration Inspection arrangeable? : yes (Including Power Inspection)
    OEM Model Description
    The P-16+ stylus profiler is a surface metrology analysis solution used in a wide range of applications and industries, from R&D; departments and universities to production and process monitoring. This surface analysis solution's precise force control provides excellent vertical resolution, precision, and reliability measurements. This surface analysis solution delivers automated step height analysis, surface contour, waviness and roughness measurements with detailed 2D or 3D analysis of topography for a variety of surfaces and materials.
    Documents

    No documents

    KLA

    P-16+

    verified-listing-icon

    Verified

    CATEGORY

    Profiler
    Last Verified: Over 60 days ago
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    49721

    Wafer Sizes:

    Unknown

    Vintage:

    2013

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
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    KLA

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    verified-listing-icon

    Verified

    CATEGORY

    Profiler
    Last Verified: Over 60 days ago
    listing-photo-ac87c7f25b1f403fb0c3062090b098be-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/45918/ac87c7f25b1f403fb0c3062090b098be/4bc6b9d9a3834c409a9ece21fcd2fd10_df23d70c49cd44b6a831d9396396c717_mw.jpeg
    listing-photo-ac87c7f25b1f403fb0c3062090b098be-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/45918/ac87c7f25b1f403fb0c3062090b098be/ad5a20355f6049dfa6b4469850da7056_0e77b765e798485bab5858bad94a9199_mw.jpeg
    listing-photo-ac87c7f25b1f403fb0c3062090b098be-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/45918/ac87c7f25b1f403fb0c3062090b098be/dc640db7d0be41e6bb4e75e7f18d4a0a_c0dbf85c9d614bd388459bc748d39da045005c_mw.jpeg
    listing-photo-ac87c7f25b1f403fb0c3062090b098be-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/45918/ac87c7f25b1f403fb0c3062090b098be/748e49647916425c8abb3545e4adc40c_711356e6020e4a708c855e3fdaf788cb45005c_mw.jpeg
    listing-photo-ac87c7f25b1f403fb0c3062090b098be-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/45918/ac87c7f25b1f403fb0c3062090b098be/69586a8a13a7424c8ba5efb62cef6f4b_9f38ead828664607b3443807cae50f1e45005c_mw.jpeg
    listing-photo-ac87c7f25b1f403fb0c3062090b098be-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/45918/ac87c7f25b1f403fb0c3062090b098be/180e485aeb894a1995a713a7a48f3dd7_304a8605cdef47a2855379a5cb3ca6f945005c_mw.jpeg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    49721

    Wafer Sizes:

    Unknown

    Vintage:

    2013

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    Condition : Fully operational, Tested Specification : 100% OEM specs Configuration : XP Computer , Software 7.45, XT head (long range), up to 200 mm Includes Step height for calibration Inspection arrangeable? : yes (Including Power Inspection)
    OEM Model Description
    The P-16+ stylus profiler is a surface metrology analysis solution used in a wide range of applications and industries, from R&D; departments and universities to production and process monitoring. This surface analysis solution's precise force control provides excellent vertical resolution, precision, and reliability measurements. This surface analysis solution delivers automated step height analysis, surface contour, waviness and roughness measurements with detailed 2D or 3D analysis of topography for a variety of surfaces and materials.
    Documents

    No documents

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