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KLA 8100XP
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    Key Item Details

    Condition:Used

    Operational Status:

    Product ID:19932

    Wafer Sizes:Unknown

    Vintage:2000

    Description

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    OEM Model Description

    The KLA-Tencor 8100XP CD SEM is a state-of-the-art scanning electron microscope used in semiconductor manufacturing. It enables precise and fast measurements of critical dimensions (CD) in small device geometries. The CD SEM has advanced capabilities for imaging and measuring high aspect ratio features, ensuring optimum device performance. It offers productivity-enhancing features such as high throughput, networking, offline recipe setup, and full system automation.

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