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HITACHI S-4700 II
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    Key Item Details

    Condition:Used

    Operational Status:

    Product ID:36387

    Wafer Sizes:Unknown

    Vintage:Unknown

    Description

    Win XP As-Is Operational Condition

    Configuration

    STEM Detector Not included with base unit. LN2 EDX Included but not attached to tool currently

    Documents
    OEM Model Description

    HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.

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