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ACCRETECH / TSK UF3000
    Description
    System 1: missing PC unit System 2: missing power pack
    Configuration
    X, Y Overall Accuracy:±2.0μm (Temp Stability ±1C) X, Y Stage Accuracy:±1.0μm Z-Axis Stroke(Applicable stroke):37mm Z-Axis Control Accuracy:±2μm Stage Durability:200kgf Hot chuck Temp. Range:50C to 150C This tool was docked with a JEC P2000A tester. INCLUDING A HINGE UNIT (MHF4000).
    OEM Model Description
    The UF3000 is a fully automatic, ultra-high function probing machine developed by ACCRETECH / TSK to be the de facto standard model for the semiconductor testing process. It meets a wide range of customer requirements, including high-mix low-volume production for System LSI and mass production for memories. The machine has received high evaluation from major device manufacturers in terms of CoO (Cost of Ownership) and OEE (Overall Equipment Efficiency).
    Documents

    No documents

    ACCRETECH / TSK

    UF3000

    verified-listing-icon

    Verified

    CATEGORY

    Probers
    Last Verified: Over 60 days ago
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    19573


    Wafer Sizes:

    12"/300mm


    Vintage:

    2006

    Have Additional Questions?
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    Available
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    Transaction Insured by Moov
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    ACCRETECH / TSK UF3000
    ACCRETECH / TSKUF3000Probers
    Vintage: 0Condition: Used
    Last Verified8 days ago

    ACCRETECH / TSK

    UF3000

    verified-listing-icon

    Verified

    CATEGORY

    Probers
    Last Verified: Over 60 days ago
    listing-photo-o0rpoymD4On12XJB-z_wYkiIq7ADeaKRVaBeujL0DY0-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/sWlmR1-OiEclbRaetZpWflkkSco6n9NoRaF8Kk8c1tI/o0rpoymD4On12XJB-z_wYkiIq7ADeaKRVaBeujL0DY0/RBpWl-7huffIaKdsh1PyTJsvP9ZvIJmCUXI9X7sJCxA_20191203_084133_f
    listing-photo-o0rpoymD4On12XJB-z_wYkiIq7ADeaKRVaBeujL0DY0-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/sWlmR1-OiEclbRaetZpWflkkSco6n9NoRaF8Kk8c1tI/o0rpoymD4On12XJB-z_wYkiIq7ADeaKRVaBeujL0DY0/5Imdqy6PMaROhHqugAUJXMClquJclsvdDw0rtX1FZC8_20191203_084133_f
    listing-photo-o0rpoymD4On12XJB-z_wYkiIq7ADeaKRVaBeujL0DY0-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/sWlmR1-OiEclbRaetZpWflkkSco6n9NoRaF8Kk8c1tI/o0rpoymD4On12XJB-z_wYkiIq7ADeaKRVaBeujL0DY0/BErJjKdLv7jhydxshyq1tM57KbjXOEQzynFLsf6JN80_20191203_084133_f
    listing-photo-o0rpoymD4On12XJB-z_wYkiIq7ADeaKRVaBeujL0DY0-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/sWlmR1-OiEclbRaetZpWflkkSco6n9NoRaF8Kk8c1tI/o0rpoymD4On12XJB-z_wYkiIq7ADeaKRVaBeujL0DY0/hHXiWOz6B8H4LWQH06axJ8QZTcDTUjVhCHB3pn5FhtE_20191203_084133_f
    listing-photo-o0rpoymD4On12XJB-z_wYkiIq7ADeaKRVaBeujL0DY0-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/sWlmR1-OiEclbRaetZpWflkkSco6n9NoRaF8Kk8c1tI/o0rpoymD4On12XJB-z_wYkiIq7ADeaKRVaBeujL0DY0/JwCi1-XTKAntmsoP1YDAEkrwdHgATr7gGjwHDvArnqw_20191203_084133_f
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    listing-photo-o0rpoymD4On12XJB-z_wYkiIq7ADeaKRVaBeujL0DY0-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/sWlmR1-OiEclbRaetZpWflkkSco6n9NoRaF8Kk8c1tI/o0rpoymD4On12XJB-z_wYkiIq7ADeaKRVaBeujL0DY0/J7OHqfvgFfK_yeUtKj8iLvIxkJ68_4_QnqhTr0x3iag_20191203_084133_f
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    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    19573


    Wafer Sizes:

    12"/300mm


    Vintage:

    2006


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    System 1: missing PC unit System 2: missing power pack
    Configuration
    X, Y Overall Accuracy:±2.0μm (Temp Stability ±1C) X, Y Stage Accuracy:±1.0μm Z-Axis Stroke(Applicable stroke):37mm Z-Axis Control Accuracy:±2μm Stage Durability:200kgf Hot chuck Temp. Range:50C to 150C This tool was docked with a JEC P2000A tester. INCLUDING A HINGE UNIT (MHF4000).
    OEM Model Description
    The UF3000 is a fully automatic, ultra-high function probing machine developed by ACCRETECH / TSK to be the de facto standard model for the semiconductor testing process. It meets a wide range of customer requirements, including high-mix low-volume production for System LSI and mass production for memories. The machine has received high evaluation from major device manufacturers in terms of CoO (Cost of Ownership) and OEE (Overall Equipment Efficiency).
    Documents

    No documents

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