Description
Has confirmed that following parts are missing. 1) APC PC board was removed and substitute board which was malfunction. 2) Power On/Off button PC board 3) On/Off Switch baseConfiguration
Tool was configured for Hot temperature range function. X,Y Overall Accuracy:±2.0μm (Temp Stability ±1\0 X,Y Stage Accuracy:±1.0μm Z Axis Stroke(Applicable stroke):37mm Z Axis Control Accuracy:±2μm Stage Durability:200kgf Hot chuck Temp. Range:50 to 150\0 Tool was docked with a JEC P2000A tester. INCLUDING A HINGE UNIT (MHF4000). Notes: Tool has been de-installed by the OEM. Tool is currently located in an off-site warehouse.OEM Model Description
The UF3000 is a fully automatic, ultra-high function probing machine developed by ACCRETECH / TSK to be the de facto standard model for the semiconductor testing process. It meets a wide range of customer requirements, including high-mix low-volume production for System LSI and mass production for memories. The machine has received high evaluation from major device manufacturers in terms of CoO (Cost of Ownership) and OEE (Overall Equipment Efficiency).Documents
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ACCRETECH / TSK
UF3000
Verified
CATEGORY
Probers
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
19072
Wafer Sizes:
Unknown
Vintage:
Unknown
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ACCRETECH / TSK
UF3000
Verified
CATEGORY
Probers
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
19072
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Has confirmed that following parts are missing. 1) APC PC board was removed and substitute board which was malfunction. 2) Power On/Off button PC board 3) On/Off Switch baseConfiguration
Tool was configured for Hot temperature range function. X,Y Overall Accuracy:±2.0μm (Temp Stability ±1\0 X,Y Stage Accuracy:±1.0μm Z Axis Stroke(Applicable stroke):37mm Z Axis Control Accuracy:±2μm Stage Durability:200kgf Hot chuck Temp. Range:50 to 150\0 Tool was docked with a JEC P2000A tester. INCLUDING A HINGE UNIT (MHF4000). Notes: Tool has been de-installed by the OEM. Tool is currently located in an off-site warehouse.OEM Model Description
The UF3000 is a fully automatic, ultra-high function probing machine developed by ACCRETECH / TSK to be the de facto standard model for the semiconductor testing process. It meets a wide range of customer requirements, including high-mix low-volume production for System LSI and mass production for memories. The machine has received high evaluation from major device manufacturers in terms of CoO (Cost of Ownership) and OEE (Overall Equipment Efficiency).Documents
No documents