Description
No descriptionConfiguration
(40) Figures internal printer COGNEX OCR Reader and T7 reader (Front / Back reading) Multi function cleaning (Maximum 3 area) Touch sensor Tag reader for FOUP cassette Remote terminal kit for UF 3000 Dew point meter Chuck blow UF 3000 Base unit with stretched loader Hot chuck nickel (Ambient to 150°C) Single FOUP loader, 12" Loader cover to protect open cassette, 8" Image data processing system Automatic PTPA / Needle height alignment Veganet SECS / GEM Ethernet I/F GPIB I/F With cable Probe Mark Inspection (PMI) Real time wafer map display Multi die test up to 256 (3) Color signal tower Bump height setting Group index Prober monitoring SBL, BM, YPS, RC Multi pass probing Soak time APC 440 Automatic probe card charger Combo head plate Insert ring for tester Service manipulator Pre-hinge CE MarkedOEM Model Description
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ACCRETECH / TSK
UF3000
Verified
CATEGORY
Photolithography
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
24144
Wafer Sizes:
Unknown
Vintage:
2005
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Logistics Support
Available
Money Back Guarantee
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Transaction Insured by Moov
Available
Refurbishment Services
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Similar Listings
View AllACCRETECH / TSK
UF3000
Verified
CATEGORY
Photolithography
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
24144
Wafer Sizes:
Unknown
Vintage:
2005
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
(40) Figures internal printer COGNEX OCR Reader and T7 reader (Front / Back reading) Multi function cleaning (Maximum 3 area) Touch sensor Tag reader for FOUP cassette Remote terminal kit for UF 3000 Dew point meter Chuck blow UF 3000 Base unit with stretched loader Hot chuck nickel (Ambient to 150°C) Single FOUP loader, 12" Loader cover to protect open cassette, 8" Image data processing system Automatic PTPA / Needle height alignment Veganet SECS / GEM Ethernet I/F GPIB I/F With cable Probe Mark Inspection (PMI) Real time wafer map display Multi die test up to 256 (3) Color signal tower Bump height setting Group index Prober monitoring SBL, BM, YPS, RC Multi pass probing Soak time APC 440 Automatic probe card charger Combo head plate Insert ring for tester Service manipulator Pre-hinge CE MarkedOEM Model Description
None ProvidedDocuments
No documents