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WYKO / VEECO SP 3200

Created On
March 1st, 2019
Guaranteed Accurate as of
6 months ago
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March 1st, 2019
6 months ago
Copied!
Share
Product ID
21924
Make
WYKO / VEECO
Model
SP 3200
Category
Metrology
Quantity
1
Serial Number
-
Vintage
-
Wafer Size
-
Condition
As-Is
Other Information
Configuration
Veeco Bruker Wyko SP9900 Large Format Optical Surface Profiler. Automated non-contact 3D critical dimension measurements. Large format surface profiling system delivers unmatched measurement performance on substrate panels, bumped substrates, flat panels and circuit boards for improved process monitoring and increased yields. High resolution imaging and patented vertical scanning interferometry system can perform accurate 3D critical dimension measurements with nanometer resolution. Powerful surface metrology instrument and defect inspection tool. Measurement Capability: Non-contact, three dimensional, surface, critical dimension, film thickness, tribology. Vertical Measurement Range: 0.1nm to 10mm. Vertical Resolution: Less than 0.1nm. RMS Repeatability: 0.01nm. No Cognex system. 115/230V, 1 Ph, 50/60 Hz, CE. Mfg.: 2008.
Description
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OEM Model Description
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